Scanning ion conductance microscopy (SICM) is a technique that allows for the imaging of biological samples with high resolution and minimal invasiveness. The technique relies on the use of a nanoscale pipette, which is positioned above the sample and used to measure the ion current flowing between the pipette and the sample. By scanning the pipette across the sample, a high-resolution image can be obtained. To perform SICM, a specialized apparatus and set of instruments are required. The most important component of the apparatus is the SICM scanner, which is used to control the position of the nanoscale pipette relative to the sample. The scanner typically consists of a set of piezoelectric actuators, which are used to move the pipette in three dimensions with high precision. In addition to the scanner, a number of other instruments are required to perform SICM. These include a high-precision voltage amplifier, which is used to measure the ion current flowing between the pipette and the sample, and a computer system for controlling the scanner and acquiring and processing data. To ensure that the SICM measurements are accurate and reliable, it is important to carefully calibrate the system and optimize the experimental parameters. This typically involves measuring the ion current under a variety of conditions and adjusting the experimental parameters to optimize the signal-to-noise ratio and minimize artifacts. Overall, the development of SICM has greatly expanded the range of biological samples that can be imaged with high resolution and minimal invasiveness. With continued advances in the development of SICM apparatus and instruments, it is likely that this technique will continue to play an important role in the study of biological systems.
scanning ion conductance microscopy, nanoscale pipette, piezoelectric actuators, voltage amplifier, calibration
CITATION : "Michael Harris. 'Apparatus And Instruments For Scanning Ion Conductance Microscopy.' Design+Encyclopedia. https://design-encyclopedia.com/?E=285948 (Accessed on May 02, 2024)"
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