Arin-X6040D Dual View X-Ray Inspection System is an advanced security screening device designed for critical infrastructure protection, exemplifying the convergence of sophisticated technology with user-centric design principles. This innovative system, designed by Oguzhan Topcuoglu and recognized with a Silver A' Design Award in the Security, Safety and Surveillance Products Design category, represents a significant advancement in X-ray inspection technology. The system features a dual-view capability that enables comprehensive scanning from multiple angles, utilizing Zeff color imaging technology and sophisticated algorithms for both organic and inorganic material classification. With dimensions of 2375 x 1142 x 1310 mm, the design incorporates sharp yet refined lines that harmonize with modern architectural environments, while its rugged construction employs bended sheet metal shells with gofrato finish for durability. The system's interface prioritizes operator ergonomics and user safety, featuring a simplified control layout, high-contrast warnings, and an intuitive graphical user interface. Notable technological capabilities include automatic explosive detection, high-density region enhancement, and geometric and radiometric correction functions. The design's aesthetic elements include reflective dark glass panels, subtle red accent lighting, and an illuminated brand identifier, creating a professional and technologically advanced appearance while maintaining functional efficiency. The system's thoughtful construction allows for easy maintenance through functionally separated panels, and its comprehensive safety features protect both operators and passengers from radiation exposure.
security screening technology, dual-view X-ray system, advanced threat detection, ergonomic interface design, critical infrastructure protection, modern security equipment
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